PDF) Detection of Delay Faults in Memory Address Decoders
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PDF) Detection of Delay Faults in Memory Address Decoders
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
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PDF) Test pattern generation based on arithmetic operations
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
Education and Information Technologies | Home
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata
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PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and Filter Bank Design
Education and Information Technologies | Home
PDF) Extending Internet into Space – ESA DTN Testbed Implementation and Evaluation
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Memory testing with a RISC microcontroller
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
PDF) An adaptive BIST to detect multiple stuck-open faults in CMOS circuits
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) UHF Receiver Front-End: Implementation and Analog Baseband Design Considerations
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PDF) Accumulator-Based Weighted Pattern Generation.
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Delay-Insensitive Cell Matrix.
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